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Lot 2.9 | KLA / Tencor 7700 Surfscan Patterned Wafer Inspection System

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Bidding on this listing starts on Wednesday, September 5, 2018 6:00:00 AM

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Auction Details

Starting Bid   ()
No Reserve   
Auction Ends Thursday, September 6, 2018 2:17:00 PM
Bid History 0 Bids
Auction Starts Wednesday, September 5, 2018 6:00:00 AM
Page Views 106 View Lots

Description

KLA  / Tencor 7700 Surfascan Patterned Wafer Inspection System

The 7700 is fixed focus wafer size. The chuck is set to one thickness and diameter. It will inspect bare wafers, rough unpatterned films and patterned wafers.

Configurations - 

  • Automatic Handling of 100mm - 200mm Wafers
  • Patterned / Unpatterned Wafer Inspection System
  • Defects Maximum Resolution 0.15 Microns
  • Scan Pitch: Max Resolution - 12.5?m between scan lines
  • XY Coordinates Accuracy within 1%
  • 30 Wafers per Hour Throughput
  • High Sensitivity on After-Etch and High Topography Applications
  • Uniphase Argon Ion Laser
  • 200mm (diameter) Low Contact Wafer Chuck
  • Blower Assembly

**The item is Crated (1 Crate) and Raedy to Ship (Located in Ireland Warehouse)

Additional Information
Location Irelead