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  Lot # 8
Ended

NANOmetrics NANOspec 6100 Series AFT Measurement System, 6" Wafer

Listing Image
  • Item ID # 635405
  • End Date
  • Start Date
  • Sold
 
Description

NANOmetrics NANOspec 6100 Series (AFT) Automated Film Thickness Measurement System with 4 Objectives, Objectives Included: Nikon 40/0.55 160/0-2.5 ELWD, Nikon 10/0.25 160/-WD5.6, Nikon 4/0.1 160/-WD25, Reflecting Objective X15/0.28, Located in Fremont, CA

 
Questions & Answers
Q: FYI. This tool is missing the computer as well as the controller. posted by: mark_CSIsemi 2/14/2019 7:38 AM PT
A: You are correct, computer/controller is NOT included.
Q: Are all of the insttrument's components available? Please send a photo? When was it last used? posted by: bstickney@cdsemi.com 1/30/2019 9:10 AM PT
A: Please call us at 510-279-4417, ask for Brian or Brad
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